The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Feb. 27, 2013
Datacolor Holding Ag, Lucerne, CH;
Zhiling Xu, West Windsor, NJ (US);
Michael H. Brill, Kingston, NJ (US);
Taeyoung Park, West Windsor, NJ (US);
Datacolor Holding AG, Lucerne, CH;
Abstract
Aligning measurements taken by a second color measurement instrument with measurements taken by first color measurement instrument, wherein the first instrument has access to a first set of standards but not a second set of standards, and the second instrument has access to the second set of standards but not the first set of standards, includes using a third color measurement instrument to generate a profile that mathematically transforms a value measured on the second set of standards to a value measured on the first set of standards, wherein the third instrument has access to the first and second sets of standards, mathematically transforming measurements of the second set of standards taken by the second instrument into virtual measurements of the first set of standards, using the profile, and aligning the measurements taken by the second instrument to the measurements taken by the first instrument, using the virtual measurements.