The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Mar. 28, 2011
Michel Pichon, Gouvieux, FR;
Franc Davenne, Thourotte, FR;
Michel Pichon, Gouvieux, FR;
Franc Davenne, Thourotte, FR;
Saint-Gobain Glass France, Courbevoie, FR;
Abstract
A device for analyzing a transparent surface of a substrate including a reference pattern facing a surface of the substrate to be measured. The reference pattern is formed on a support of short and long extents. A camera is provided for taking at least one image of the reference pattern distorted by the measured substrate. A reference pattern illumination system and a processor for processing the image and digital analysis are connected to the camera. The support is of oblong shape and the reference pattern is a one-directional pattern that extends along the shortest extent of the support. The pattern is transversely periodic to the short extent, and the camera is a linear camera.