The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Jul. 28, 2011
Szu-hao Lyu, Taipei, TW;
Chien-nan Yu, Taipei, TW;
Szu-Hao Lyu, Taipei, TW;
Chien-Nan Yu, Taipei, TW;
Primax Electronics Ltd., Taipei, TW;
Abstract
An optical analysis method is provided for judging whether a lens and a sensing element of an image pickup device are parallel with each other. The method utilizes a tested image pickup device and a standard image pickup device to shoot an object at the same fixed shooting position to acquire a standard image frame and a tested image frame. According to the difference between the position coordinate value or the area of at least one mark of the standard image frame and the tested image frame, the method can judge whether the tested lens and the tested sensing element of the tested image pickup device are parallel with each other.