The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Jul. 02, 2010
Frederic Cao, Boulogne-Billancourt, FR;
Frederic Guichard, Paris, FR;
Ayham Nseir, Paris, FR;
DxO Labs, Boulogne-Billancourt, FR;
Abstract
The invention relates to a method for estimating a defect in an image-capturing system (I), which produces, with regard to any first image (I), representing any scene (S), a variation in the field of a characteristic of the first image, having an order of magnitude that is statistically lower than a variation in the field of said characteristic added by the scene. The method comprises: calculating, in at least a first portion of the field of the first image, a measurement (μ(I)) related to said characteristic of the first image, an estimative magnitude (ν) of said defect, depending on the calculated measurement and having a variation having the same order of magnitude as the variation in the field of said characteristic of the first image produced by said defect.