The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
Jun. 27, 2011
David Peter Gerrard, Magnolia, TX (US);
Omar H. Balcazar, Houston, TX (US);
David Peter Gerrard, Magnolia, TX (US);
Omar H. Balcazar, Houston, TX (US);
Baker Hughes Incorporated, Houston, TX (US);
Abstract
A method and apparatus for measuring a parameter of an object is disclosed. The object is placed within a vessel configured to contain the object via an opening in the vessel. A cover is placed over the opening. A securing device is used to secure the cover to the vessel. A measurement device is used to measure the parameter of the object at a raised pressure. The parameter can be a nuclear magnetic resonance parameter of the object. A fluid in the vessel can be heated to raise the pressure within the sealed vessel. In various embodiments, the securing device can be a second cover or a clamp, for example. The measured parameter can be used in determining a suitability of the object for use in downhole environments.