The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Mar. 23, 2012
Applicants:

Koichi Ishii, Kawasaki, JP;

Kazuhiro Suzuki, Tokyo, JP;

Hiroto Honda, Yokohama, JP;

Hideyuki Funaki, Tokyo, JP;

Risako Ueno, Tokyo, JP;

Honam Kwon, Kawasaki, JP;

Inventors:

Koichi Ishii, Kawasaki, JP;

Kazuhiro Suzuki, Tokyo, JP;

Hiroto Honda, Yokohama, JP;

Hideyuki Funaki, Tokyo, JP;

Risako Ueno, Tokyo, JP;

Honam Kwon, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/20 (2006.01); H01L 27/146 (2006.01); G01J 5/14 (2006.01);
U.S. Cl.
CPC ...
G01J 5/14 (2013.01); H01L 27/14649 (2013.01);
Abstract

An infrared imaging device, including: connection wiring portions arranged in matrix form on a substrate which is mounted in a package; first and second infrared detecting portions configured to convert intensity of absorbed infrared radiation into respective first and second signals, the second infrared detecting portion being smaller in thermal conductance than the first infrared detecting portion; and a lid member attached to the package so as to define an air-tight gap with the substrate, the connection wiring portions, the first and second infrared detecting portions being accommodated within the gap; wherein a degree-of-vacuum is measured within the gap and a warning issued based on the measured degree-of-vacuum.


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