The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2014
Filed:
May. 09, 2013
Shimadzu Corporation, Kyoto, JP;
Takashi Sumiyoshi, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
After an analysis condition table for measuring each compound is automatically generated in accordance with a compound table, the loop time is calculated for each measurement section for which the overlapping of measurement events differs. If the loop time exceeds a specified value in a given measurement section of a given compound, the event with the earliest end time and the event with the latest start time are extracted from among the overlapping measurement events, and the intermediate time between the end time and the start time is found to adjust the length of each measurement event. By repeating this process, a parameter in the analysis condition table is corrected so that the loop time becomes equal to or less than the specified value.