The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Jun. 07, 2012
Applicants:

Leonardus Leunissen, Hamme-Mille, BE;

Sandip Halder, Heverlee, BE;

Eric Beyne, Leuven, BE;

Inventors:

Leonardus Leunissen, Hamme-Mille, BE;

Sandip Halder, Heverlee, BE;

Eric Beyne, Leuven, BE;

Assignee:

IMEC, Leuven, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting embedded voids present in a structure formed in or on a semiconductor substrate is described. The method includes performing a processing step Pfor forming the structure; measuring the mass Mof the substrate; performing thermal treatment; measuring the mass Mof the substrate; calculating the mass difference between the mass of the substrate measured before and after the performed thermal treatment; and deducing the presence of embedded voids in the structure by comparing the mass difference with a pre-determined value.


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