The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Jul. 23, 2012
Applicants:

Steven M. Barlow, Lawrence, KS (US);

Jingyan Wang, Lawrence, KS (US);

Inventors:

Steven M. Barlow, Lawrence, KS (US);

Jingyan Wang, Lawrence, KS (US);

Assignee:

University of Kansas, Lawrence, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01); A61B 5/117 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus are provided for generating an index associated with non-nutritive suck pattern stability. An example apparatus can include an STI generator configured to generate a plurality of non-nutritive suck (NNS) pressure samples using a non-nutritive pacifier and a pressure transducer, and to sum a plurality of standard deviations based on the plurality of NNS pressure samples to provide a spatiotemporal index (STI) of non-nutritive suck pattern stability, wherein the STI is configured to provide a composite indication of variability of amplitude, and duration of a plurality of portions of the NNS pressure samples.


Find Patent Forward Citations

Barlow, Steven. (2014). Method and apparatus for measuring non-nutritive suck pattern stability (U.S. Patent No. 8734367). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8734367

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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