The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2014

Filed:

Jun. 23, 2010
Applicants:

Michael R. Burcher, Cambridge, GB;

Hua Xie, Ossining, NY (US);

Anna Teresa Fernandez, Falls Church, VA (US);

Jean-luc Robert, White Plains, NY (US);

Inventors:

Michael R. Burcher, Cambridge, GB;

Hua Xie, Ossining, NY (US);

Anna Teresa Fernandez, Falls Church, VA (US);

Jean-Luc Robert, White Plains, NY (US);

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Shear wave dispersion ultrasound vibrometry (SDUV) is implemented in some embodiments to form, from a single tracking pulse, in-parallel-directed receive lines (-) for making measurements of a monochromatic shear wave. In some embodiments, sampling is performed, over spatial locations by means of passes over the locations, in an interlaced pattern () for making measurements of the wave. In some embodiments, measurements are made of the wave and to the measurements are applied a bank of filters (S) that are tuned to respective candidate wave speeds, all without the need to determine a difference between wave phases at different spatial locations (-).


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