The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Nov. 18, 2010
Masayoshi Yokota, Tokyo, JP;
Sumito Nakano, Tokyo, JP;
Masayoshi Yokota, Tokyo, JP;
Sumito Nakano, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A nondestructive testing apparatus includes a display section and a storage section which stores predetermined executable functions. Each of the predetermined functions is initially set to one of a permitted state and a disabled state, and one of a display state and a non-display state on the display section. In an initial state, at least one of the predetermined functions is set to the disabled state and the non-display state. The nondestructive testing apparatus can receive permission information which unlocks at least one of the predetermined functions initially set to the disabled state so as to be set to the permitted state, and unlocks at least one of the predetermined functions initially set in the non-display state so as to be in the display state. The apparatus displays an operation icon only with respect to all of the predetermined functions set to the display state.