The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2014

Filed:

Sep. 23, 2011
Applicant:

Sung Bin Park, Gyeonggi-do, KR;

Inventor:

Sung Bin Park, Gyeonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a method for testing an application in a testing agent which resides on an application layer of a mobile communication terminal mounted with a platform designed so that applications of the application layer operate independently from each other and a command is not directly transferred between the applications. The method includes: receiving a command for testing a test target application from a testing apparatus; generating an event corresponding to the transferred command; and registering the generated event in a window manager positioned on a framework layer in order to transfer the generated event to the test target application.


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