The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2014

Filed:

Dec. 19, 2011
Applicants:

Satnam Singh, Bangalore, IN;

John V Bowman, Farmington, MI (US);

Inventors:

Satnam Singh, Bangalore, IN;

John V Bowman, Farmington, MI (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

System fault codes, component fault codes, and failure modes may be received at a system. A first level model comprising first level causal relationships and first level causal weights between the system fault codes and the component fault codes may be generated. A second level model comprising second level causal relationships and second level causal weights between the component fault codes and the failure modes may be generated. The first level model and the second level model may be combined to generate a model such as graphical model. One or more causal probabilities may be determined using the graphical model.


Find Patent Forward Citations

Singh, Satnam. (2014). Method and system for root cause analysis and quality monitoring of system-level faults (U.S. Patent No. 8732112). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8732112

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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