The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2014

Filed:

Nov. 19, 2010
Applicants:

Marek K. Czernuszenko, Sugar Land, TX (US);

Lucas J. Hilliard, Oslo, NO;

Kelly G. Walker, Sugar Land, TX (US);

Jose J. Sequeira, Jr., The Woodlands, TX (US);

Neal L. Adair, Sugar Land, TX (US);

Timothy A. Chartrand, Spring, TX (US);

Alan R. Wild, Humble, TX (US);

Inventors:

Marek K. Czernuszenko, Sugar Land, TX (US);

Lucas J. Hilliard, Oslo, NO;

Kelly G. Walker, Sugar Land, TX (US);

Jose J. Sequeira, Jr., The Woodlands, TX (US);

Neal L. Adair, Sugar Land, TX (US);

Timothy A. Chartrand, Spring, TX (US);

Alan R. Wild, Humble, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 7/60 (2006.01); G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
G06F 17/50 (2013.01); G06F 17/5018 (2013.01); G06F 17/5036 (2013.01); G06F 17/5004 (2013.01);
Abstract

There is provided a system and method for providing a visualization of data describing a physical structure. An exemplary method comprises defining an unstructured grid that corresponds to a three-dimensional physical structure, the unstructured grid comprising data representative of a property of interest. The exemplary method also comprises defining a probe as an object that comprises a set of topological elements, at least one of which does not share a common plane. The exemplary method additionally comprises providing a visualization of the unstructured grid data on the geometry defined by the probe.


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