The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2014

Filed:

Mar. 30, 2006
Applicants:

Yoshihiro Mishima, Kobe, JP;

Terutaka Yauchi, Hiroshima, JP;

Inventors:

Yoshihiro Mishima, Kobe, JP;

Terutaka Yauchi, Hiroshima, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analyzing system, data processing apparatus, and application program are provided that can display the measurement results and/or analysis results of a plurality of different types of measuring apparatuses on a user interface that is easily comprehended by the user. The data processing apparatus is capable of displaying on a screen the measurement results and analysis results of a plurality of measuring apparatuses that perform mutually different kinds of measurements of specimens. A plurality of measurement item group switching buttons are provided on the display screen, and specimen information tables that correspond to each measurement item can be displayed by a user clicking on the buttons.


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