The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Apr. 09, 2012
Jinxi Shen, San Ramon, CA (US);
David R. Walker, Ottawa, CA;
Leonid Frenkel, Palo Alto, CA (US);
Yu Zhang, Kanata, CA;
Barthelemy Fondeur, San Jose, CA (US);
Vlatko Milinkovic, Ottawa, CA;
Yimin Hua, Los Altos, CA (US);
Jinxi Shen, San Ramon, CA (US);
David R. Walker, Ottawa, CA;
Leonid Frenkel, Palo Alto, CA (US);
Yu Zhang, Kanata, CA;
Barthelemy Fondeur, San Jose, CA (US);
Vlatko Milinkovic, Ottawa, CA;
Yimin Hua, Los Altos, CA (US);
JDS Uniphase Corporation, Milpitas, CA (US);
Abstract
A tunable optical filter is configured to take point measurements at a few optical frequencies per frequency channel of a DWDM optical network. The measurement frequencies are shifted by pre-determined amounts relative to the optical frequency channel being characterized. Since the spectral shape of the tunable optical filter is known, the center optical frequency, the modulation bandwidth, and the total optical power of the channel can be obtained from as few as three optical measurements. The center optical frequency and the total optical power can be continuously monitored by providing a tunable filter stage coupled to an interleaver stage, and computing a ratio and a weighted sum the optical signals at the two outputs of the interleaver stage.