The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Sep. 24, 2012
Wei Hao, Superior, CO (US);
Alexander C. Loui, Penfield, NY (US);
Cathleen D. Cerosaletti, Rochester, NY (US);
Wei Hao, Superior, CO (US);
Alexander C. Loui, Penfield, NY (US);
Cathleen D. Cerosaletti, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method for determining an estimated clutter level of an input digital image based on an inequality index. The inequality index is determined by partitioning the input digital image into small sub-images and analyzing the sub-images to determine a set of image features. The image features are associated with a set of designated reference features, and the inequality index is determined based on the statistical variation of the reference features. The inequality index is compared to a predefined threshold to classify the input digital image as a rich-content image or a low-content image. For rich-content images, the estimated clutter level is determined responsive to a set of scene content features relating to spatial structures or semantic content of the input digital image is determined by analyzing the input digital image. For low-content images, the estimated clutter level is determined responsive to an overall luminance level.