The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Jan. 16, 2012
Steven G. Adie, Urbana, IL (US);
Paul Scott Carney, Champaign, IL (US);
Stephen A. Boppart, Champaign, IL (US);
Steven G. Adie, Urbana, IL (US);
Paul Scott Carney, Champaign, IL (US);
Stephen A. Boppart, Champaign, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
Methods for correcting for aberrations in the image or three-dimensional reconstruction of a sampled region obtained by broadband interferometry. The sampled region is illuminated with a broadband beam of light, and light returned from the sample is detected, along with a reference beam, in order to derive an interference signal for pixels of a volume spanned by wavenumber and axes transverse to the beam propagation direction. An optimization procedure is performed with respect to a specified criterion so as to obtain an aberration-corrected image of at least one plane of the sampled region, either in a plane-specific manner or in a space-invariant manner throughout the sampled region. A filter function, which may be derived from the interference signal attendant to irradiating a sparsely distributed plurality of point scatterers, or otherwise, corrects for a detected aberrated point spread function. Methods of the present invention may be used for aberration correction in reading information from an optical data storage medium.