The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Dec. 17, 2009
Applicants:
Kai Zeng, Niskayuna, NY (US);
Bruno Kristiaan Bernard Deman, Clifton Park, NY (US);
Jean-baptiste Thibault, Waukesha, WI (US);
Inventors:
Kai Zeng, Niskayuna, NY (US);
Bruno Kristiaan Bernard DeMan, Clifton Park, NY (US);
Jean-Baptiste Thibault, Waukesha, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/03 (2013.01);
Abstract
Methods and systems are provided for correcting artifacts in iterative reconstruction processes. In certain embodiments, weighting schemes may be applied such that less than all of the available scan or projection data is utilized in the iterative reconstruction. In this manner, inconsistencies in the data undergoing reconstruction may be reduced.