The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
May. 25, 2012
James Copland, Albuquerque, NM (US);
James Copland, Albuquerque, NM (US);
AMO Wavefront Sciences, LLC., Santa Ana, CA (US);
Abstract
A method of compensating for misalignment between an optical measurement instrument and a model eye includes: receiving a light beam from the model eye at the optical measurement instrument; producing image data, including light spot data for a plurality of light spots, from the received light beam; determining an observed location of a corneal reflex from the model eye within an image representing the image data; and determining an angle of misalignment between an axis normal to the front surface of the model eye and the optical axis of the optical measurement instrument from the observed location of the corneal reflex within the image.