The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2014

Filed:

Nov. 30, 2011
Applicant:

Bernd Rothenberger, Rheinhausen, DE;

Inventor:

Bernd Rothenberger, Rheinhausen, DE;

Assignee:

Sick AG, Waldkirch, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sensor arrangement for object recognition in a monitored zone is provided having a first and second distance-measuring optoelectronic sensor whose fields of vision overlap, and having a common control unit which is formed for determining a position of a calibration target in the overlap region with respect to the first and second sensor to determine a transformation instruction between coordinate systems of the sensors in a registration mode so that measured points of the sensors can be combined in a common global coordinate system. The common control unit is designed to determine positions of the calibration target with respect to the first and second sensor and to determine that transformation instruction which brings a connection line between the positions with respect to the first sensor's coordinate system to cover the connection line between the positions with respect to second sensor's coordinate system.


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