The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2014

Filed:

Oct. 19, 2011
Applicants:

P. Selvan Viswanathan, Redmond, WA (US);

Mark Champion, Kenmore, WA (US);

David Lashmet, Bainbridge Island, WA (US);

Inventors:

P. Selvan Viswanathan, Redmond, WA (US);

Mark Champion, Kenmore, WA (US);

David Lashmet, Bainbridge Island, WA (US);

Assignee:

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/042 (2006.01);
U.S. Cl.
CPC ...
Abstract

Briefly, in accordance with one or more embodiments, an image or projection cone is projected onto a projection surface via a raster scan to generate the image, or in a light cone. Movements of two or more input sources with respect to projection cone are detected, and a determination is made whether the input sources have crossed a crossover line in the projection cone. If the input sources have moved greater than a threshold amount after crossing the crossover line, position data between the input sources may be exchanged to reflect proper position data for the input sources.


Find Patent Forward Citations

Viswanathan, P.. (2014). Multipoint source detection in a scanned beam display (U.S. Patent No. 8730210). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8730210

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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