The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Aug. 25, 2011
Aziz Mahfoud Familia, Shrewsbury, MA (US);
David Shackleford, Framingham, MA (US);
Nafih Mekhilef, Northborough, MA (US);
Mike Zimmerman, North Andover, MA (US);
Aziz Mahfoud Familia, Shrewsbury, MA (US);
David Shackleford, Framingham, MA (US);
Nafih Mekhilef, Northborough, MA (US);
Mike Zimmerman, North Andover, MA (US);
Saint-Gobain Performance Plastics Corporation, Aurora, OH (US);
Abstract
The present invention is directed to systems and methods which utilize a cavity ring-down spectroscopy (CRDS) technique implemented for the measurements of vapor transmission rate. In one embodiment, the vapor content to be measured is contained within an optical cavity. Light is then injected into the cavity up to a threshold level and the decay time of the injected light is measured. When the wavelength of the injected light is resonant with an absorption feature of the vapor the decay time increases linearly as a function of vapor content. In this manner, vapor content causes a longer decay time and thus the amount of vapor passing through the film (film permeation rate) can be determined in real-time.