The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
Mar. 09, 2011
Keisuke Kuwano, Kobe, JP;
Daigo Fukuma, Kobe, JP;
Keisuke Kuwano, Kobe, JP;
Daigo Fukuma, Kobe, JP;
Sysmex Corporation, Kobe, JP;
Abstract
The present invention is a sample analyzer including: a first and a second measurement unit configured to measure a sample accommodated in a sample container; a rack transport unit configured to transport each of a plurality of sample containers held in a sample rack to either the first or the second measurement unit; and a controller configured to acquire a measurement item information indicating a measurement item of each of samples accommodated in the plurality of sample containers held in the sample rack, determine a sample container to be a transport object and a measurement unit to be a transport destination of the sample container based on the acquired plurality of measurement item information, and control the rack transport unit to transport the sample container determined as the transport object to the measurement unit determined as the transport destination.