The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2014
Filed:
May. 20, 2010
John F. Shakespeare, Hiltulanlahti, FI;
John F. Shakespeare, Hiltulanlahti, FI;
Honeywell International Inc., Morristown, NJ (US);
Abstract
A method includes receiving a measurement associated with an anisotropy of a first surface and a measurement associated with an anisotropy of a second surface of a sheet of material. The method also includes adjusting an operating parameter associated with a headbox based on the measurements. The headbox is associated with manufacture of the sheet. The operating parameter could include a jet speed, a jet impingement angle, a jet thickness, a slice opening, and/or a slice apron projection. Adjusting the operating parameter could be based on a difference between a measured anisotropy of the first surface and a measured anisotropy of the second surface. For example, the operating parameter could be adjusted to achieve a desired difference between the measured anisotropy of the first surface and the measured anisotropy of the second surface. Multiple headboxes could be controlled, such as when different headboxes are used to produce different layers of a multi-layer sheet.