The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Jul. 29, 2011
Shamachary Sathish, Bellbrook, OH (US);
Vijayaraghava Nalladega, Loveland, OH (US);
Kumar V Jata, Dayton, OH (US);
Mark P Blodgett, Dayton, OH (US);
Shamachary Sathish, Bellbrook, OH (US);
Vijayaraghava Nalladega, Loveland, OH (US);
Kumar V Jata, Dayton, OH (US);
Mark P Blodgett, Dayton, OH (US);
The United States of America as represented by the Secretary of the Air Force, Washington, DC (US);
Abstract
An atomic force microscope (AFM) system capable of imaging multiple physical properties of a sample material at the nanoscale level. The system provides an apparatus and method for imaging physical properties using an electromagnetic coil placed under the sample. Excitation of the coil creates currents in the sample, which may be used to image a topography of the sample, a physical property of the sample, or both.