The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2014

Filed:

Mar. 29, 2012
Applicants:

Nir Merry, Mountain View, CA (US);

Stephen Moffatt, St. Lawrence, JE;

Kailash Patalay, Santa Clara, CA (US);

David Keith Carlson, San Jose, CA (US);

Inventors:

Nir Merry, Mountain View, CA (US);

Stephen Moffatt, St. Lawrence, JE;

Kailash Patalay, Santa Clara, CA (US);

David Keith Carlson, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F26B 3/30 (2006.01); F26B 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the invention generally contemplate an apparatus and method for monitoring and controlling the temperature of a substrate during processing. One embodiment of the apparatus and method takes advantage of an infrared camera to obtain the temperature profile of multiple regions or the entire surface of the substrate and a system controller to calculate and coordinate in real time an optimized strategy for reducing any possible temperature non-uniformity found on the substrate during processing.


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