The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Oct. 25, 2011
Yuichi Fujiki, Houston, TX (US);
Norman Haas, Mount Kisco, NY (US);
Ying LI, Mohegan Lake, CT (US);
Charles A. Otto, Lansing, MI (US);
Balamanohar Paluri, Atlanta, GA (US);
Sharathchandra Pankanti, Darien, CT (US);
Yuichi Fujiki, Houston, TX (US);
Norman Haas, Mount Kisco, NY (US);
Ying Li, Mohegan Lake, CT (US);
Charles A. Otto, Lansing, MI (US);
Balamanohar Paluri, Atlanta, GA (US);
Sharathchandra Pankanti, Darien, CT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system, method, and computer program product for detecting anomalies in an image. In an example embodiment the method includes partitioning each image of a set of images into a plurality of image local units. The method further includes clustering all local units in the image set into clusters, and consequently assigning a class label to each local unit based on the clustering results. The local units with identical class labels having at least one substantially related image feature. Further, the method includes assigning a weight to each of the local units based on a variation of the class labels across all images in a set of images. The method further includes performing a clustering over all images in the set by using a distance metric that takes the learned weight of each local unit into account, then determining the images that belong to minorities of the clusters as anomalies.