The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Oct. 18, 2011
Alexander Zamyatin, Hawthorn Woods, IL (US);
Thomas Labno, Palatine, IL (US);
Alexander Zamyatin, Hawthorn Woods, IL (US);
Thomas Labno, Palatine, IL (US);
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Medical Systems Corporation, Otawara-Shi, JP;
Abstract
Streak artifacts arise in helical CT reconstruction with cone beam weighting (CBW) with helical pitch ratio between 0.5 and 1.0 in a prevalent 2PI mode. The sreak artifacts are substantially removed by applying upsampling to the measured data in the segment direction before weighting. Furthermore, by making the upsampling adaptive to the view Z-position, an amount of extra processing is greatly reduced to near 1%.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile