The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Dec. 08, 2010
Dijia Wu, North Brunswick, NJ (US);
Le LU, Chalfont, PA (US);
Jinbo BI, Chester Springs, PA (US);
Yoshihisa Shinagawa, Downingtown, PA (US);
Marcos Salganicoff, Bala Cynwyd, PA (US);
Dijia Wu, North Brunswick, NJ (US);
Le Lu, Chalfont, PA (US);
Jinbo Bi, Chester Springs, PA (US);
Yoshihisa Shinagawa, Downingtown, PA (US);
Marcos Salganicoff, Bala Cynwyd, PA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
Described herein is a framework for automatically classifying a structure in digital image data are described herein. In one implementation, a first set of features is extracted from digital image data, and used to learn a discriminative model. The discriminative model may be associated with at least one conditional probability of a class label given an image data observation Based on the conditional probability, at least one likelihood measure of the structure co-occurring with another structure in the same sub-volume of the digital image data is determined. A second set of features may then be extracted from the likelihood measure.