The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Sep. 08, 2011
Applicants:
Edwin G. Haas, Sayville, NY (US);
Christopher Stelmach, Holbrook, NY (US);
Zhong Zhong, Stony Brook, NY (US);
Inventors:
Edwin G. Haas, Sayville, NY (US);
Christopher Stelmach, Holbrook, NY (US);
Zhong Zhong, Stony Brook, NY (US);
Assignee:
Brookhaven Science Associates, LLC, Upton, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
An x-ray focusing device and method for adjustably focusing x-rays in two orthogonal directions simultaneously. The device and method can be operated remotely using two pairs of orthogonal benders mounted on a rigid, open frame such that x-rays may pass through the opening in the frame. The added x-ray flux allows significantly higher brightness from the same x-ray source.