The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2014

Filed:

Nov. 29, 2011
Applicants:

Lawrence Wai Cheung Ho, Mississauga, CA;

Eric Sin Kwok Chiu, Mississauga, CA;

Inventors:

Lawrence Wai Cheung Ho, Mississauga, CA;

Eric Sin Kwok Chiu, Mississauga, CA;

Assignee:

Kingtiger Technology (Canada) Inc., Markham, Ontario, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments described herein relate to systems and methods for testing and assembling memory modules. In at least one embodiment, the method comprises, for each memory device of a plurality of memory devices, based on testing performed on the memory device, determining whether the memory device has any defective memory locations, and if so, identifying the one or more defective memory locations, and generating data that identifies the one or more defective memory locations on the memory device; and assembling a memory module comprising at least one memory device having one or more defective memory locations; wherein the assembling comprises, for each memory device of the memory module having one or more defective memory locations, storing the data that identifies the one or more defective memory locations on the memory device in a persistent store on the memory module.


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