The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2014

Filed:

Oct. 14, 2008
Applicants:

Simon Chen, San Jose, CA (US);

Jen-chan Chien, Saratoga, CA (US);

Hailin Jin, San Jose, CA (US);

Inventors:

Simon Chen, San Jose, CA (US);

Jen-Chan Chien, Saratoga, CA (US);

Hailin Jin, San Jose, CA (US);

Assignee:

Adobe Systems Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for processing collections of images are described in which metadata from a set of images may be used in directing a multi-image processing workflow. One or more output images may be rendered from a set of input images, with each output image being some combination of two or more of the input images. To render an output image, a workflow including one or more processing steps may be applied to the images. Metadata may be used in directing and performing the workflow. For example, metadata may be used in determining a particular workflow for a set of images. As another example, metadata may be used to sort a collection of images into multiple categories for automated workflow processing. As yet another example, metadata may be used to retrieve information stored in a profile database that may be used in processing the images.


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