The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Mar. 16, 2011
Hiroshi Sasaki, Hachioji, JP;
Hiroshi Sasaki, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
An endoscope system includes an imaging section that includes an optical system and an imaging element, an observation mode setting section that sets an object observation mode, a diaphragm control section that selects a diaphragm state based on the observation mode, and an image processing section that processes an image acquired by the imaging section. The diaphragm control section selecting a first diaphragm state when the observation mode is a first observation mode. The first diaphragm state being a state in which a resolution determined by a diffraction limit based on a diaphragm of the optical system is lower than a resolution determined by the imaging element. The diaphragm control section selecting a second diaphragm state when the observation mode is a second observation mode. The second diaphragm state being a state in which the resolution determined by the diffraction limit based on the diaphragm of the optical system is equal to or higher than the resolution determined by the imaging element.