The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2014

Filed:

Jan. 17, 2012
Applicants:

Tsugio Yamamoto, Gunma, JP;

Takeshi Todoroki, Gunma, JP;

Inventors:

Tsugio Yamamoto, Gunma, JP;

Takeshi Todoroki, Gunma, JP;

Assignee:

Yokowo Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A contact probe includes: a first and second plungers, one of the first and second plungers being connected to an object to be inspected, the other being connected to an inspecting board; and a spring urging the first and second plungers so as to be separated from each other. The first plunger includes a distal end side columnar part and a flange part. The flange part includes a first portion that has a first length from a center point, which is, greater than a radius of the distal end side columnar part, in a first direction perpendicular to an axial direction, and includes a second portion that has a second length from the center point, which is smaller than the radius of the distal end side columnar part, in a second direction perpendicular to the axial direction and different from the first direction.


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