The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2014

Filed:

Oct. 31, 2011
Applicants:

Seung Yong Kim, Daejeon, KR;

Hyun Sik Kim, Daejeon, KR;

Myoung Choul Choi, Chungbuk, KR;

Jong Shin Yoo, Seoul, KR;

Inventors:

Seung Yong Kim, Daejeon, KR;

Hyun Sik Kim, Daejeon, KR;

Myoung Choul Choi, Chungbuk, KR;

Jong Shin Yoo, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a controller and a control method for improving signal performance of an ion cyclotron resonance mass spectrometer. The controller and control method apply electric signals for causing ions injected into an ion trap of the ion cyclotron resonance mass spectrometer to be injected to the center of the trap as close as possible to trap electrodes, and adjust biased ion motion by appropriately adjusting signals of trap electrodes for causing the injected ions to make ion motion, thereby improving the fidelity of ion signals. The control method for improving signal performance of an ion cyclotron resonance mass spectrometer includes an ion position adjustment process and an ion signal detection process.


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