The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Sep. 13, 2012
Applicants:
Dong Sun, Kowloon, HK;
Xiaolin Wang, Kowloon, HK;
Inventors:
Dong Sun, Kowloon, HK;
Xiaolin Wang, Kowloon, HK;
Assignee:
City University of Hong Kong, Hong Kong, HK;
Primary Examiner:
Int. Cl.
CPC ...
G21K 5/04 (2006.01); G21K 1/00 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G21K 1/00 (2013.01); G01N 21/17 (2013.01); G21K 1/003 (2013.01); G21K 1/006 (2013.01);
Abstract
The present invention is concerned with a system for sorting target particles from a flow of particles. The system has a microscope, a light source, a CCD camera, microfluidic chip device with microfluidic channels, a detection apparatus for detecting the target particles with predefined specific features, a response generating apparatus for generating a signal in response to the detection of the target particles, and an optical tweezing system for controlling movement of optical traps, the optical tweezing system is operably linked to the response signal.