The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Feb. 23, 2010
Applicants:
Edward J. Bawolek, Chandler, AZ (US);
Curtis D. Moyer, Phoenix, AZ (US);
Sameer M. Venugopal, San Jose, CA (US);
Inventors:
Edward J. Bawolek, Chandler, AZ (US);
Curtis D. Moyer, Phoenix, AZ (US);
Sameer M. Venugopal, San Jose, CA (US);
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 22/00 (2013.01);
Abstract
The present invention provides devices capable of testing the electrical performance of thin-film transistor backplane arrays and methods for their use.
Bawolek, Edward. (2014). Methods and system for on-chip decoder for array test (U.S. Patent No. 8722432). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8722432
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile