The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2014

Filed:

Sep. 26, 2005
Applicants:

Thomas M. Baer, Mountain View, CA (US);

Michael G. Youngquist, Palo Alto, CA (US);

Brian W. Donovan, San Jose, CA (US);

Alan E. Wessel, Santa Clara, CA (US);

Norbert H. Leclerc, Mountain View, CA (US);

Michael A. Smith, San Jose, CA (US);

George M. Dawson, Los Gatos, CA (US);

Craig S. Barker, San Carlos, CA (US);

Inventors:

Thomas M. Baer, Mountain View, CA (US);

Michael G. Youngquist, Palo Alto, CA (US);

Brian W. Donovan, San Jose, CA (US);

Alan E. Wessel, Santa Clara, CA (US);

Norbert H. Leclerc, Mountain View, CA (US);

Michael A. Smith, San Jose, CA (US);

George M. Dawson, Los Gatos, CA (US);

Craig S. Barker, San Carlos, CA (US);

Assignee:

Life Technologies Corporation, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for automated laser microdissection are disclosed including automatic slide detection, position detection of cutting and capture lasers, focus optimization for cutting and capture lasers, energy and duration optimization for cutting and capture lasers, inspection and second phase capture and/or ablation in a quality control station and tracking information for linking substrate carrier or output microdissected regions with input sample or slide.


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