The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2014

Filed:

May. 06, 2011
Applicants:

Jean-francois Mainguet, Grenoble, FR;

Alain Chambron, Saint-Egreve, FR;

Guy-michel Parat, Claix, FR;

Inventors:

Jean-Francois Mainguet, Grenoble, FR;

Alain Chambron, Saint-Egreve, FR;

Guy-Michel Parat, Claix, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for calibrating an electronic chip comprises: the placing of a calibration transducer of a chip to be calibrated in contact with a first element and the measurement of a corresponding temperature variation ΔTc with this calibration transducer, the calibration thermal transducer having thermal characteristics different from those of the normal transducer so as to measure a temperature variation ΔTc that is different from a variation ΔT1 measured by the normal transducer, and the calibration of the chip to be calibrated on the basis of the measured variations ΔT1 and ΔTc.


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