The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
Nov. 27, 2008
Isabelle Lavrador, Charenton-le-Pont, FR;
Xavier Lippens, Charenton-le-Pont, FR;
Alain Chansavoir, Charenton-le-Pont, FR;
Philippe Larue, Charenton-le-Pont, FR;
Daniel Steigelman, Charenton-le-Pont, FR;
Loïc Kabelaan, Charenton-le-Pont, FR;
Jean-françois Cailloux, Charenton-le-Pont, FR;
Isabelle Lavrador, Charenton-le-Pont, FR;
Xavier Lippens, Charenton-le-Pont, FR;
Alain Chansavoir, Charenton-le-Pont, FR;
Philippe Larue, Charenton-le-Pont, FR;
Daniel Steigelman, Charenton-le-Pont, FR;
Loïc Kabelaan, Charenton-le-Pont, FR;
Jean-François Cailloux, Charenton-le-Pont, FR;
Essilor International (Compagnie Generale d'Optique), Charenton le Pont, FR;
Abstract
A process for controlling a lens manufacturing process comprising the steps of: a) manufacturing a master lens according to a manufacturing process using a manufacturing device, b) measuring by using at least a measuring device at least one parameter of the master lens of step a), c) recording the value of the parameter, d) repeating regularly step a) to c) and checking the evolution of the parameter over time, wherein the evolution of at least one parameter of the manufacturing device used during the lens manufacturing process is checked over time and the evolution over time of at least one parameter of the master lens is related with the evolution over time of the at least one parameter of the manufacturing device.