The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2014
Filed:
May. 29, 2012
Samuel Chen, Penfield, NY (US);
Mark C. Rzadca, Fairport, NY (US);
Samuel Chen, Penfield, NY (US);
Mark C. Rzadca, Fairport, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A print media in a printing system includes multiple test patterns with each test pattern having one or more marks. Each test pattern can have a different number of marks. A method for detecting size variations in the print media while the print media is moving through the printing system includes scanning the test patterns as the print media is moving in a transport direction to produce test pattern signals, with each signal representing a respective test pattern, and analyzing the measured test pattern signals to determine whether a size variation has occurred in the print media. One or more compensation values can be determined based on the size variation. If a size variation is detected, the operation or setting of one or more components in the printing system can be adjusted based on the one or more compensation values.