The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Nov. 08, 2011
Sergei V. Kalinin, Knoxville, TN (US);
Nina Balke, Knoxville, TN (US);
Amit Kumar, Oak Ridge, TN (US);
Nancy J. Dudney, Knoxville, TN (US);
Stephen Jesse, Knoxville, TN (US);
Sergei V. Kalinin, Knoxville, TN (US);
Nina Balke, Knoxville, TN (US);
Amit Kumar, Oak Ridge, TN (US);
Nancy J. Dudney, Knoxville, TN (US);
Stephen Jesse, Knoxville, TN (US);
UT-Battelle, LLC, Oak Ridge, TN (US);
Abstract
A method and system for probing mobile ion diffusivity and electrochemical reactivity on a nanometer length scale of a free electrochemically active surface includes a control module that biases the surface of the material. An electrical excitation signal is applied to the material and induces the movement of mobile ions. An SPM probe in contact with the surface of the material detects the displacement of mobile ions at the surface of the material. A detector measures an electromechanical strain response at the surface of the material based on the movement and reactions of the mobile ions. The use of an SPM tip to detect local deformations allows highly reproducible measurements in an ambient environment without visible changes in surface structure. The measurements illustrate effective spatial resolution comparable with defect spacing and well below characteristic grain sizes of the material.