The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Dec. 08, 2011
Applicants:

Naoto Maeda, Tokyo, JP;

Franjo Ivancic, Princeton, NJ (US);

Sriram Sankaranarayanan, Boulder, CO (US);

Aarti Gupta, Princeton, NJ (US);

Inventors:

Naoto Maeda, Tokyo, JP;

Franjo Ivancic, Princeton, NJ (US);

Sriram Sankaranarayanan, Boulder, CO (US);

Aarti Gupta, Princeton, NJ (US);

Assignees:

NEC Laboratories America, Inc., Princeton, NJ (US);

NEC Corporation, , JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scalable, computer implemented method for finding subtle flaws in software programs. The method advantageously employs 1) scope bounding which limits the size of a generated model by excluding deeply-nested function calls, where the scope bounding vector is chosen non-monotonically, and 2) automatic specification inference which generates constraints for functions through the effect of a light-weight and scalable global analysis. Advantageously, scalable software model checking is achieved while at the same time finding more bugs.


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