The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Mar. 07, 2011
Yoram Simha Adler, Haifa, IL;
Rachel Tzoref-brill, Haifa, IL;
Moshe Klausner, Ramat Yishay, IL;
Orna Pelleg Raz, Haifa, IL;
Onn Menahem Shehory, Yahud-Monosson, IL;
Aviad Zlotnick, Mitzpeh Netofah, IL;
Yoram Simha Adler, Haifa, IL;
Rachel Tzoref-Brill, Haifa, IL;
Moshe Klausner, Ramat Yishay, IL;
Orna Pelleg Raz, Haifa, IL;
Onn Menahem Shehory, Yahud-Monosson, IL;
Aviad Zlotnick, Mitzpeh Netofah, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Test coverage is enhanced by measuring various types of coupling between coverage tasks. The coupling measurements may be implicit coupling measurements, explicit coupling measurements, coding coupling measurements, performance coupling measurements, resource coupling measurements or the like. Coupling scores are calculated for coverage tasks and based thereon ranking of the coverage tasks or groups of coverage tasks may be determined The ranking may be utilized in selecting for which uncovered coverage task a test should be designed. The ranking may be utilized in computing a coverage measurement of a test suite. The ranking may be utilized to rank tests, based on the coverage tasks each test covers. Ranking of tests may be utilized for various purposes such as performing test selection.