The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Sep. 14, 2011
Applicants:

Subramanyam Satyasurya Chamarti, Johns Creek, GA (US);

Bruce Joni Tomson, Marietta, GA (US);

Michael George Glazebrook, Marietta, GA (US);

Scott Michael Shill, Atlanta, GA (US);

Inventors:

Subramanyam Satyasurya Chamarti, Johns Creek, GA (US);

Bruce Joni Tomson, Marietta, GA (US);

Michael George Glazebrook, Marietta, GA (US);

Scott Michael Shill, Atlanta, GA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described herein are embodiments of methods and systems for detecting communications of a first meter board by a second meter board and correlating the time and duration of the communications with metrology data gathered during that time. In accordance with one aspect, a method is provided for diagnosing metrology errors caused by communication activities of a meter board. In one embodiment, the method includes: receiving a signal, wherein the signal indicates a presence of communication activities between a first processor of a meter and another device over a network; recording a time of receipt and duration of the communication activities between the first processor of the meter and another device over the network; and correlating the time and duration of the communication activities between the first processor of the meter and another device over the network with metrology data of the meter measured at the same time and duration.


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