The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Sep. 09, 2011
Applicants:

Hongwei YE, Kenosha, WI (US);

Wenli Wang, Briarcliff Manor, NY (US);

Inventors:

Hongwei Ye, Kenosha, WI (US);

Wenli Wang, Briarcliff Manor, NY (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G01T 1/20 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2985 (2013.01);
Abstract

A method, device, and system for calculating first and second distance ratios used to calculate a geometric probability between a voxel and a tube-of-response (TOR). The method includes determining a first-edge-line including a first-middle-point, determining a second-edge-line including a second-middle-point, determining a middle line of the TOR, projecting a first point of a first surface of the voxel to the middle line, projecting a second point of a second surface of the voxel to the middle line, calculating a first distance between one of the first and second middle-points and the first-projected-point, and a second distance between the one of the first and second middle-points and the second-projected-point, and determining a first distance ratio based on the first and second distances. The method calculates the second distance ratio similarly to the first distance ratio. The geometric probability is proportional to the product of the first and second distance ratios.


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