The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Aug. 12, 2011
Peter Hesketh, Atlanta, GA (US);
Sankar Nair, Atlanta, GA (US);
Ken Mccarley, Bartlesville, OK (US);
Milad Navaei, Atlanta, GA (US);
Kevin Bagnall, Bartlesville, OK (US);
Anandram Venkatasubramanian, Atlanta, GA (US);
Peter Hesketh, Atlanta, GA (US);
Sankar Nair, Atlanta, GA (US);
Ken McCarley, Bartlesville, OK (US);
Milad Navaei, Atlanta, GA (US);
Kevin Bagnall, Bartlesville, OK (US);
Anandram Venkatasubramanian, Atlanta, GA (US);
Phillip 66 Company, Houston, TX (US);
Georgia Tech Research Corporation, Atlanta, GA (US);
Abstract
Described is an apparatus for measuring mass change under high pressure, comprising: a high pressure cell comprising a reference quartz crystal microbalance sensor and a sample quartz crystal microbalance sensor, wherein the sample quartz crystal microbalance sensor is coated with a test sample selected from the group consisting of nanoporous materials and metal-organic frameworks; a pressure sensor operatively connected to the high pressure cell; a thermocouple operatively connected to the high pressure cell, wherein the high pressure cell is maintained at a pre-selected temperature; a gas inlet fluidly connected to the high pressure cell; and a gas outlet fluidly connected to the high pressure cell. Also described are methods of making and using the apparatus.
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