The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2014
Filed:
Nov. 07, 2008
Applicant:
Brent D. Cameron, Waterville, OH (US);
Inventor:
Brent D. Cameron, Waterville, OH (US);
Assignee:
The University of Toledo, Toledo, OH (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/1455 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
A61B 5/00 (2013.01); A61B 5/0002 (2013.01); A61B 5/1455 (2013.01); A61B 5/14555 (2013.01); A61B 5/14532 (2013.01); A61B 5/14558 (2013.01);
Abstract
A noninvasive polarimetric apparatus used to measure levels of a substance in a sample in the presence of dynamically changing sample birefringence is provided. A polarization system generates multiple states of polarized light which interact with the sample. An analyzer system receives a signal from the sample and generates a secondary signal. This signal is detected and then processed to measure levels of a substance in a sample that may be have time varying birefringent components.