The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2014

Filed:

Jul. 31, 2008
Applicants:

Lei Xu, Princeton, NJ (US);

Junqiang HU, Princeton, NJ (US);

Ting Wang, West Windsor, NJ (US);

Dayou Qian, Plainsboro, NJ (US);

Yutaka Yano, Tokyo, JP;

Inventors:

Lei Xu, Princeton, NJ (US);

Junqiang Hu, Princeton, NJ (US);

Ting Wang, West Windsor, NJ (US);

Dayou Qian, Plainsboro, NJ (US);

Yutaka Yano, Tokyo, JP;

Assignees:

NEC Laboratories America, Inc., Princeton, NJ (US);

NEC Corporation, , JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/61 (2013.01);
U.S. Cl.
CPC ...
Abstract

A method includes producing interference between a received optical OFDM signal and an optical carrier extracted from the received optical OFDM signal to provide optical coherent detection of the received optical OFDM signal. Preferably, producing the interference includes optically splitting the received optical OFDM signal into a first part that is filtered to extract the carrier from the received optical OFDM signal and a second part similar to the received optical OFDM signal.


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